Electronic Properties at Gold/Conjugated‐Polyelectrolyte Interfaces

• DOI: 10.1002/adma.200802420
• Publication Date: 2008-12-31T20:27:30Z
• Authors: Jung Hwa Seo; Renqiang Yang; Jacek Z. Brzezinski; Bright Walker; Guillermo C. Bazan; Thuc‐Quyen Nguyen
• Keywords: 01 natural sciences; 0104 chemical sciences

ofVL(D 0) provides a larger electron-injection barrier (fe). [8–10] XPS and UPS studies are typically carried out by growing organic thin films of progressive thicknesses atop a metallic surface or a single crystal. [11] These films are usually deposited in several steps, and are subsequently analyzed without breaking the vacuum. [8–12] In contrast, polymers are nonvolatile, and are therefore commonly processed from solution by methods that do not offer as good a control over layer thickness. [13] Most polymer/ metal interfaces have been studied by evaporating the metal in situ on ex-situ-prepared films. [14] Examples of the reverse procedure are scarce. [15] In this contribution, we investigate the electronic structures of one neutral conjugated polymer and three CPEs using XPS and UPS. Control of film thickness was achieved by varying the spin-casting speed and the solution concentration. As shown in Scheme 1, the materials studied are poly[9,9-bis[6 0 -(N,N,N- tri