Imaging Nanoscale Morphology of Semiconducting Polymer Films with Photoemission Electron Microscopy

• DOI: 10.1002/adma.201701012
• Publication Date: 2017-05-17T11:07:01Z
• Authors: Andreas Neff; Falk Niefind; Bernd Abel; Stefan C. B. Mann...; Katrin R. Siefermann
• Keywords: Photoemission electron microscopy; Characterization; Direct imaging

Photoemission electron microscopy in combination with polarized laser light is presented as a tool permitting direct imaging of polymer‐chain orientation and local degree order semicrystalline samples semiconducting polymers, promising class materials for future electronics. The key advantages this are its nondestructive fast measurements, straightforward data analysis, the low complexity sample preparation, possibility performing measurements on broad variety technologically relevant substrates. high spatial resolution microscope provides insights into nanoscale morphology, which material's performance electronic devices.