Film‐Depth‐Dependent Light Reflection Spectroscopy for Photovoltaics and Transistors

• DOI: 10.1002/admi.202101476
• Publication Date: 2021-10-25T06:12:56Z
• Authors: Zichao Shen; Yihang Jiang; Jinde Yu; Yuanwei Zhu; Laju Bu; Guanghao Lu
• Keywords: Opacity; Reflection

Abstract Organic thin films are widely investigated for solar cells, field‐effect transistors, and other film devices. However, rare methods available to characterize the film‐depth dependent variations of materials. Here, a film‐depth‐dependent light reflection spectroscopy polymer is proposed sequentially show optical properties at each consequently vertical phase segregation films, which applicable both transparent opaque systems. Synchronic acquirement transmission spectra during soft plasma etching optimizes profiling resolution toward 1 nm, applied organic cells transistors characterizations.