Ion‐Charged Dielectric Nanolayers for Enhanced Surface Passivation in High Efficiency Photovoltaic Devices

• DOI: 10.1002/admi.202300037
• Publication Date: 2023-04-19T02:59:58Z
• Authors: Isabel Al‐Dhahir; Xinya Niu; Mingzhe Yu; Shona McNab; Yingsi Lin; Pietro P. Altermatt; Christopher E. Pa...; Ruy Sebastian Bon...
• Keywords: Passivation; Charge carrier

Abstract The power conversion efficiency of solar cells is strongly impacted by an unwanted loss charge carriers occurring at semiconductor surfaces and interfaces. Here the use ion‐charged oxide nanolayers to enhance passivation silicon via field effect mechanism reported. first report enhanced from rubidium cesium provided. state formation energy dioxide are calculated principles. Ion embedding demonstrated exploited control interface population minimize electron‐hole pair recombination. quality directly improves with concentration, yet excess ions can produce detrimental states. An optimal ionic concentration ≈1.5 × 10 12 q cm −2 deduced, a recombination velocity current density as low 2.8 s −1 7.8 fA achieved Si‐SiO 2 interface. Maximized shown provide improvements high 0.7% absolute. This work provides unique route without compromising film synthesis, thus retaining antireflection hydrogenation properties. As such, dielectrics complementary paths for surface optimization in future single‐junction tandem cells.