Convergent beam diffraction studies of interfaces, defects, and multilayers

• DOI: 10.1002/jemt.1060130204
• Publication Date: 2005-02-24T08:20:22Z
• Authors: D. Cherns; A. R. Preston
• Keywords: Aperiodic graph; Reflection

This paper explains how the convergent beam electron diffraction (CBED) and large angle (LACBED) techniques can be used to study crystal defects, bicrystals, multilayers. It is shown LACBED technique in particular derive magnitude sign of Burgers vectors dislocations displacements at stacking faults. For bicrystals multilayers examined plan-view, gives rocking curve for a chosen reflection. enables layer strains measured approximately 0.1% composition profiles derived both periodic aperiodic structures. that simple kinematic approach interpret essential results most cases.