Static SIMS studies of the oxides and hydroxides of aluminium

• DOI: 10.1002/jms.1121
• Publication Date: 2006-11-20T14:07:27Z
• Authors: S. Verdier; J. B. Metson; H. M. Dunlop
• Keywords: 02 engineering and technology; 0210 nano-technology

AbstractThe degree of hydroxylation or hydration of aluminium surfaces has been examined by static secondary ion mass spectroscopy (SSIMS). The SSIMS spectra of a series of aluminium oxide, oxyhydroxide and hydroxide surfaces have been obtained using instruments in three configurations. Similarities were observed in both negative and positive secondary ions spectra. Even though a direct comparison of the relative intensities cannot be made from one instrument to the other, a similar ranking of the various aluminium hydroxylation states was observed. Several ranking methods are discussed, as well as the similarities and differences observed while using the three instruments. Similar secondary ions were detected whatever the degree of hydroxylation of the aluminium oxide. This argues in favour of the formation of fragments by the combination of individually sputtered atoms or clusters to form the more stable secondaries, rather than the kick‐off of ‘structure‐related’ clusters originating directly from the upper surface layer. Copyright © 2006 John Wiley & Sons, Ltd.