Surface‐enhanced Raman spectroscopy on novel black silicon‐based nanostructured surfaces
02 engineering and technology
0210 nano-technology
DOI:
10.1002/jrs.2213
Publication Date:
2009-02-11T18:06:04Z
AUTHORS (5)
ABSTRACT
AbstractTwo different black silicon nanostructured surfaces modified with thin gold layers were tested for analytical signal enhancement with Surface‐Enhanced Raman Spectroscopy (SERS). The relationship between the thicknesses of the gold layers and the analytical signal enhancement was studied. Also, effects of Ti and Ti/Pt adhesion layers underneath the gold layers on the analytical signal enhancement were tested. An enhancement factor of 7.6 × 107 with the excitation laser 785 nm was achieved for the tested analyte, Rhodamine 6G, and non‐resonance SER spectra were recorded in a 5 s acquisition mode. Such an enhancement enables to achieve a detection limit down to 2.4 pg of Rhodamine 6G on a black silicon‐based nanosurface coated with a 400‐nm‐thin layer of gold. Copyright © 2009 John Wiley & Sons, Ltd.
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