Formation of Micrometer‐Sized Textured Hexagonal Silicon Crystals via Nanoindentation

Micrometer
DOI: 10.1002/sstr.202400552 Publication Date: 2025-03-12T05:29:59Z
ABSTRACT
A comprehensive study on the formation of micrometer‐sized, textured hexagonal diamond silicon (hd‐Si) crystals via nanoindentation followed by annealing is presented. Utilizing advanced characterization techniques such as polarized Raman spectroscopy, high‐resolution transmission electron microscopy, and energy‐loss successful transformation into high‐quality hd‐Si demonstrated. The experimental results are further supported first‐principles calculations molecular dynamics simulations. Notably, phase consists nanometer‐sized grains with slight misorientations, organized large micrometer‐scale domains. These findings underscore potential a precise versatile tool for inducing pressure‐driven transformations, particularly stabilization silicon. nature also presents unique opportunity to tailor its optical properties, opening new avenues application in semiconductor optoelectronic devices.
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