The triple Si δ -doped GaAs structure
Triple junction
DOI:
10.1007/s00339-003-2285-3
Publication Date:
2004-03-19T18:21:51Z
AUTHORS (4)
ABSTRACT
For the uniform donor distribution we have theoretically investigated the influence of the separation between the adjacent two doping layers on the electronic structure of the triple Si δ-doped GaAs, at T=0 K. To find the subband structure of the triple δ-doped quantum well we have solved self-consistently both Schrodinger and Poisson equations. From our calculations, we have seen that the electronic properties of triple Si δ-doped GaAs structure depend strongly on the spacer thickness between the adjacent two doping layers. In this study, we can estimate that the mobility in closely spaced triple δ-doped GaAs structures is very high compared to single δ-doped structures because of the overlap between the electron wave function and the ionized scattering centres in single δ-doped structures.
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