Ion-beam analysis for cultural heritage on the AGLAE facility: impact of PIXE/RBS combination

• DOI: 10.1007/s00339-008-4512-4
• Publication Date: 2008-05-23T10:35:21Z
• Authors: J. Salomon; J.-C. Dran; T. Guillou; B. Moignard; L. Pichon; P. Walter; F. Mathis
• Keywords: Ion beam analysis; Rutherford backscattering spectrometry; Beam energy; Historical heritage

The combination of particle-induced X-ray emission (PIXE) and Rutherford backscattering (RBS) is particularly fruitful for the study of cultural heritage objects. Several set-ups have been developed at the AGLAE facility of the Louvre Laboratory to implement these techniques with an external beam. Successively have been tested the simultaneous use of PIXE and RBS with a single beam of protons, the sequential application of PIXE with protons and RBS with 4He2+ ions and finally the simultaneous implementation of PIXE and RBS with high-energy 4He2+ ions. Several examples illustrate the benefits of these combinations of techniques.