A Label-Free Measurement Method for Plane Stress States in Optical Isotropic Films with Spectroscopic Ellipsometry
DOI:
10.1007/s11340-023-01026-w
Publication Date:
2024-01-24T22:02:01Z
AUTHORS (7)
ABSTRACT
SUPPLEMENTAL MATERIAL
Coming soon ....
REFERENCES (26)
CITATIONS (0)
EXTERNAL LINKS
PlumX Metrics
RECOMMENDATIONS
FAIR ASSESSMENT
Coming soon ....
JUPYTER LAB
Coming soon ....