Comparison of single-event upset generated by heavy ion and pulsed laser

• DOI: 10.1007/s11432-016-0346-1
• Publication Date: 2017-06-15T04:47:13Z
• Authors: Bin Liang; Ruiqiang Song; Jianwei Han; Yaqing Chi; Rui Chen; Chunmei Hu; Jianjun Chen; Yingqi Ma; Shipeng Shangguan
• Keywords: Upset; Single event upset

Single-event upset (SEU) is investigated using heavy ion and pulsed laser. The measured SEU cross sections of D and DICE flip-flops are compared. Measurement results indicate pulsed laser is capable of inducing similar SEU to those induced by heavy ion. 3D-TCAD simulation is performed to investigate the factors to impact pulsed laser induced SEU. Simulation results show that the beam spot size significantly impacts SEU cross sections in both low and high laser energy while the variation of the equivalent LET only impacts SEU cross sections in the low laser energy.