Atomic Force Microscopy Techniques for Nanomechanical Characterization: A Polymeric Case Study

• DOI: 10.1007/s11837-015-1340-9
• Publication Date: 2015-03-05T10:56:00Z
• Authors: Melania Reggente; Marco Rossi; Livia Angeloni; Emanuela Tamburri; Massimiliano Lucci; Ivan Davoli; Maria Letizia Ter...; Daniele Passeri
• Keywords: indentation; Engineering (all); Materials Science (all); PANI; 0103 physical sciences; 600; AFM; polymrers; 01 natural sciences; Settore CHIM/03 - CHIMICA GENERALE E INORGANICA; Settore FIS/01 - FISICA SPERIMENTALE

Atomic force microscopy (AFM) is a versatile tool to perform mechanical characterization of surface samples at the nanoscale. In this work, we review two of such methods, namely contact resonance AFM (CR-AFM) and torsional harmonics AFM (TH-AFM). First, such techniques are illustrated and their applicability on materials with elastic moduli in different ranges are discussed, together with their main advantages and limitations. Then, a case study is presented in which we report the mechanical characterization using both CR-AFM and TH-AFM of polyaniline and polyaniniline doped with nanodiamond particles tablets prepared by a pressing process. We determined the indentation modulus values of their surfaces, which were found in fairly good agreement, thus demonstrating the accuracy of the techniques. Finally, the determined surface elastic moduli have been compared with the bulk ones measured through standard indentation testing.