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Hydroxyethyl Cellulose Charge Trap Layer for Water-Degradable Short-Term Transistor Memory

Trap (plumbing) Hydroxyethyl cellulose Non-Volatile Memory
DOI: 10.1007/s13391-025-00553-z Publication Date: 2025-02-22T18:51:31Z
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AUTHORS (6)
Jeong-In Lee
Baeksang Sung
Joo Won Han
Yong Hyun Kim
Jonghee Lee
Min-Hoi Kim
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