Temperature-controlled defect engineering in ceria nanostructures using thin film VO2-CeOx bilayers

• DOI: 10.1016/j.apsusc.2024.159808
• Publication Date: 2024-02-29T06:13:59Z
• Authors: Udit Kumar; Corbin Feit; Jeya Prakash Ganesan; S. Novia Berriel; Yifei Fu; Craig J. Neal; Elayaraja Kolanthai; Parag Banerjee; Sudipta Seal
• Keywords: Ellipsometry; Deposition