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Positive bias stress reliability of InSnO TFTs: Analysis and Improvement strategies

DOI: 10.1016/j.apsusc.2025.163061 Publication Date: 2025-03-23T12:20:11Z
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AUTHORS (8)
Tingrui Huang
Jie Cao
Zuoxu Yu
Yuzhen Zhang
Wenting Xu
Guangan Yang
Weifeng Sun
Wangran Wu
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