Angle-dependent spectral reflectance material dataset based on 945 nm time-of-flight camera measurements

• DOI: 10.1016/j.dib.2023.109031
• Publication Date: 2023-03-03T02:45:55Z
• Authors: David J. Ritter; Relindis Rott; Birgit Schlager; Stefan Muckenhuber; Simon Genser; Martin Kirchengast; Marcus Hennecke
• Keywords: Table (database)

The main objective of this article is to provide angle-dependent spectral reflectance measurements various materials in the near infrared spectrum. In contrast already existing libraries, e.g., NASA ECOSTRESS and Aster which consider only perpendicular measurements, presented dataset includes angular resolution material reflectance. To conduct a new measurement device based on 945 nm time-of-flight camera used, was calibrated using Lambertian targets with defined values at 10, 50, 95%. are taken for an angle range 0° 80° 10° incremental steps stored table format. developed categorized novel classification, divided into four different levels detail considering properties distinguishing predominantly between mutually exclusive classes (level 1) types 2). published open access repository Zenodo record number 7467552 version 1.0.1 [1]. Currently, contains 283 continuously extended versions Zenodo.