Failure mode and effect analysis of a large scale thin-film CIGS photovoltaic module

• DOI: 10.1016/j.engfailanal.2017.02.004
• Publication Date: 2017-02-16T03:18:30Z
• Authors: Jose-Maria Delgad...; Emilio Sanchez-Co...; Carmen Lopez-Lopez; R. Aninat; Maria D. Alba
• Keywords: Degradation; Failure mechanism

The efficiency of thin-film CIGS based cells at the laboratory scale is now getting closer to conventional Silicon technologies. As a consequence, the long-term stability of CIGS is now one of the main challenges left to address in order to assess its potential as an alternative for photovoltaic plants. This paper reports an overview of the critical risks for the commercial viability of the CIGS thin-film technology. The key causes of the potential failures of this technology are determined through the Failure Mode Analysis and Effects (FMEA) methodology. To validate the results obtained from the FMEA, aging tests and outdoor monitoring were also carried out. Based on the results obtained, we argue that the encapsulation material is the main cause of degradation in CIGS modules.