Collection mode near-field scanning microwave microscopy

• DOI: 10.1016/j.ijleo.2013.10.085
• Publication Date: 2014-02-04T20:45:16Z
• Authors: R. Cortés; V. Coello; R. Arriaga; N. Elizondo
• Keywords: 0103 physical sciences; 01 natural sciences

Abstract Collection mode near-field microscopy is demonstrated using a 10.56 GHz (X-band) frequency illumination. Imaging of a standing evanescent microwave was experimentally used to evaluate the capabilities of the microscope. The microscope functionality was validated by imaging near field interactions of different systems of dipole-like resonances. We prove that those microscope images contain near-field information by presenting numerical modeling of dipole-like resonant interactions. The model makes use of an analytic Dyadic Green's which is based in the near-field electrostatic approximation. We propose that this microscopy technique can be used, with certain limitations, as a check for 2D mapping of designed (spoof) surface plasmon at microwave frequencies.