A method of verifying the statistical performance of electronic circuits designed to analyze the power quality

• DOI: 10.1016/j.measurement.2016.06.061
• Publication Date: 2016-07-01T14:40:38Z
• Authors: Wilmar Hernandez; Carlos Calderón-C...; Eduardo Brito; Eduardo Campoverde; Vicente González-...; José G. Zato
• Keywords: Statistical Inference; Rank (graph theory)

The main contribution of this paper is that a novel method verification the statistical performance electronic circuits have been specifically designed to analyze power quality proposed. based on Wilcoxon signed-rank test and Levene test, which are nonparametric inference techniques, it establishes relation exists between measurement results obtained using reference instrument circuit under test. In addition, says whether device differs significantly from what would be expected. Finally, in order show feasibility proposed method, prototype was practical application shown. idea can also used wide range different industrial applications.