A comprehensive model of PMOS NBTI degradation

• DOI: 10.1016/j.microrel.2004.03.019
• Publication Date: 2004-08-05T15:25:56Z
• Authors: M.A. Alam; S. Mahapatra
• Keywords: Negative-bias temperature instability; Degradation; Circuit reliability

Abstract Negative bias temperature instability has become an important reliability concern for ultra-scaled Silicon IC technology with significant implications for both analog and digital circuit design. In this paper, we construct a comprehensive model for NBTI phenomena within the framework of the standard reaction–diffusion model. We demonstrate how to solve the reaction–diffusion equations in a way that emphasizes the physical aspects of the degradation process and allows easy generalization of the existing work. We also augment this basic reaction–diffusion model by including the temperature and field-dependence of the NBTI phenomena so that reliability projections can be made under arbitrary circuit operating conditions.