Crystal growth and detector performance of large size High-purity Ge crystals

• DOI: 10.1016/j.mssp.2015.04.044
• Publication Date: 2015-05-14T18:32:27Z
• Authors: Guojian Wang; Mark Amman; Hao Mei; Dongming Mei; Klaus Irmscher; Yutong Guan; Gang Yang
• Keywords: Crystal (programming language); Semiconductor detector; Particle detector; Czochralski method

High-purity germanium crystals approximately 12 cm in diameter were grown in a hydrogen atmosphere using the Czochralski method. The dislocation density of the crystals was determined to be in the range of 2000 - 4200 cm-2, which meets a requirement for use as a radiation detector. The axial and radial distributions of impurities in the crystals were measured and are discussed. A planar detector was also fabricated from one of the crystals and then evaluated for electrical and spectral performance. Measurements of gamma-ray spectra from Cs-137 and Am-241 sources demonstrate that the detector has excellent energy resolution.<br/>22 pages, 11 figures, Accepted for publication in Materials Science in Semiconductor Processing<br/>