Classification and evaluation for nearside/backside defect via magnetic flux leakage: A dual probe design with SVM and PSO intelligence algorithms
Magnetic Flux Leakage
SIGNAL (programming language)
Leakage (economics)
Lift (data mining)
DOI:
10.1016/j.ndteint.2024.103100
Publication Date:
2024-03-24T19:59:01Z
AUTHORS (5)
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