Beam tests of ATLAS SCT silicon strip detector modules

• DOI: 10.1016/j.nima.2004.08.133
• Publication Date: 2004-10-15T15:21:27Z
• Authors: F. Campabadal; C. Fleta; M. Key; M. Lozano; C. Martinez; G. Pellegrini; J.M. Rafi; M. Ullan; L. Johansen; B. Pommeresche; B. Stugu; A. Ciocio; V. Fadeyev; M. Gilchriese; C. Haber; J. Siegrist; H. Spieler; C. Vu; P.J. Bell; D.G. Charlton; J.D. Dowell; B.J. Gallop; R.J. Homer; P. Jovanovic; G. Mahout; T.J. McMahon; J.A. Wilson; A.J. Barr; J.R. Carter; B.P. Fromant; M.J. Goodrick; J.C. Hill; C.G. Lester; M.J. Palmer; M.A. Parker; D. Robinson; A. Sabetfakhri; R.J. Shaw; F. Anghinolfi; E. Chesi; S. Chouridou; R. Fortin; J. Grosse-Knetter; M. Gruwe; P. Ferrari; P. Jarron; J. Kaplon; A. Macpherson; T. Niinikoski; H. Pernegger; S. Roe; A. Rudge; G. Ruggiero; R. Wallny; P. Weilhammer; W. Bialas; W. Dabrowski; P. Grybos; S. Koperny; J. Blocki; P. Bruckman; S. Gadomski; J. Godlewski; E. Gornicki; P. Malecki; A. Moszczynski; E. Stanecka; M. Stodulski; R. Szczygiel; M. Turala; M. Wolter; A. Ahmad; J. Benes; C. Carpentieri; L. Feld; C. Ketterer; J. Ludwig; J. Meinhardt; K. Runge; B. Mikulec; M. Mangin-Brinet; M. D’Onofrio; M. Donega; S. Moêd; A. Sfyrla; D. Ferrere; A.G. Clark; E. Perrin; M. Weber; R.L. Bates; A. Cheplakov; D.H. Saxon; V. O’Shea; K.M. Smith; Y. Iwata; T. Ohsugi; T. Kohriki; T. Kondo; S. Terada; N. Ujiie; Y. Ikegami; Y. Unno; R. Takashima; T. Brodbeck; A. Chilingarov; G. Hughes; P. Ratoff; T. Sloan; P.P. Allport; G.-L. Casse; A. Greenall; J.N. Jackson; T.J. Jones; B.T. King; S.J. Maxfield; N.A. Smith; P. Sutcliffe; J. Vossebeld; G.A. Beck; A.A. Carter; S.L. Lloyd; A.J. Martin; J. Morris; J. Morin; K. Nagai; T.W. Pritchard; B.E. Anderson; J.M. Butterworth; T.J. Fraser; T.W. Jones; J.B. Lane; M. Postranecky; M.R.M. Warren; V. Cindro; G. Kramberger; I. Mandić; M. Mikuž; I.P. Duerdoth; J. Freestone; J.M. Foster; M. Ibbotson; F.K. Loebinger; J. Pater; S.W. Snow; R.J. Thompson; T.M. Atkinson; G. Bright; S. Kazi; S. Lindsay; G.F. Moorhead; G.N. Taylor; G. Bachindgagyan; N. Baranova; D. Karmanov; M. Merkine; L. Andricek; S. Bethke; J. Kudlaty; G. Lutz; H.-G. Moser; R. Nisius; R. Richter; J. Schieck; T. Cornelissen; G.W. Gorfine; F.G. Hartjes; N.P. Hessey; P. de Jong; A.J.M. Muijs; S.J.M. Peeters; Y. Tomeda; R. Tanaka; I. Nakano; O. Dorholt; K.M. Danielsen; T. Huse; H. Sandaker; S. Stapnes; P. Bargassaa; A. Reichold; T. Huffman; R. Nickerson; A. Weidberg; G. Doucas; B. Hawes; W. Lau; D. Howell; N. Kundu; R. Wastie; J. Bohm; M. Mikestikova; J. Stastny; Z. Broklová; J. Brož; Z. Doležal; P. Kodyš; P. Kubík; P. Řezníček; V. Vorobel; I. Wilhelm; D. Chren; T. Horazdovsky; V. Linhart; S. Pospisil; M. Sinor; M. Solar; B. Sopko; I. Stekl; E.N. Ardashev; S.N. Golovnya; S.A. Gorokhov; A.G. Kholodenko; R.E. Rudenko; V.N. Ryadovikov; A.P. Vorobiev; P.J. Adkin; R.J. Apsimon; L.E. Batchelor; J.P. Bizzell; P. Booker; V.R. Davis; J.M. Easton; C. Fowler; M.D. Gibson; S.J. Haywood; C. MacWaters; J.P. Matheson; R.M. Matson; S.J. McMahon; F.S. Morris; M. Morrissey; W.J. Murray; P.W. Phillips; M. Tyndel; E.G. Villani; D.E. Dorfan; A.A. Grillo; F. Rosenbaum; H.F.-W. Sadrozinski; A. Seiden; E. Spencer; M. Wilder; P. Booth; C.M. Buttar; I. Dawson; P. Dervan; C. Grigson; R. Harper; A. Moraes; L.S. Peak; K.E. Varvell; Ming-Lee Chu; Li-Shing Hou; Shih-Chang Lee; Ping-Kun Teng; Changchun Wan; K. Hara; Y. Kato; T. Kuwano; M. Minagawa; H. Sengoku; N. Bingefors; R. Brenner; T. Ekelöf; L. Eklund; J. Bernabeu; J.V. Civera; M.J. Costa; J. Fuster; C. Garcia; J.E. Garcia; S. Gonzalez-Sevilla; C. Lacasta; G. Llosa; S. Marti-Garcia; P. Modesto; J. Sanchez; L. Sospedra; M. Vos; D. Fasching; S. Gonzalez; R.C. Jared; E. Charles
• Keywords: Tracking (education); Semiconductor detector

The design and technology of the silicon strip detector modules for the Semiconductor Tracker (SCT) of the ATLAS experiment have been finalised in the last several years. Integral to this process has been the measurement and verification of the tracking performance of the different module types in test beams at the CERN SPS and the KEK PS. Tests have been performed to explore the module performance under various operating conditions including detector bias voltage, magnetic field, incidence angle, and state of irradiation up to 3×1014 protons per square centimetre. A particular emphasis has been the understanding of the operational consequences of the binary readout scheme.