Beam test of a segmented foil SEM grid

Accelerator Physics (physics.acc-ph) General Physics Physics - Instrumentation and Detectors Beam Profiles FOS: Physical sciences Electrons Instrumentation and Detectors (physics.ins-det) 7. Clean energy High Energy Physics - Experiment Monitors High Energy Physics - Experiment (hep-ex) 03 medical and health sciences 0302 clinical medicine Fermilab Proton Transport General Physics Physics - Accelerator Physics 71 Classical And Quantum Mechanics
DOI: 10.1016/j.nima.2005.08.076 Publication Date: 2005-09-15T02:49:52Z
ABSTRACT
submitted to Nucl. Instr. Meth. A<br/>A prototype Secondary-electron Emission Monitor (SEM) was installed in the 8 GeV proton transport line for the MiniBooNE experiment at Fermilab. The SEM is a segmented grid made with 5 um Ti foils, intended for use in the 120 GeV NuMI beam at Fermilab. Similar to previous workers, we found that the full collection of the secondary electron signal requires a bias voltage to draw the ejected electrons cleanly off the foils, and this effect is more pronounced at larger beam intensity. The beam centroid and width resolutions of the SEM were measured at beam widths of 3, 7, and 8 mm, and compared to calculations. Extrapolating the data from this beam test, we expect a centroid and width resolutions of 20um and 25 um, respectively, in the NuMI beam which has 1 mm spot size.<br/>
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