Beam test of a segmented foil SEM grid
Accelerator Physics (physics.acc-ph)
General Physics
Physics - Instrumentation and Detectors
Beam Profiles
FOS: Physical sciences
Electrons
Instrumentation and Detectors (physics.ins-det)
7. Clean energy
High Energy Physics - Experiment
Monitors
High Energy Physics - Experiment (hep-ex)
03 medical and health sciences
0302 clinical medicine
Fermilab
Proton Transport General Physics
Physics - Accelerator Physics
71 Classical And Quantum Mechanics
DOI:
10.1016/j.nima.2005.08.076
Publication Date:
2005-09-15T02:49:52Z
AUTHORS (11)
ABSTRACT
submitted to Nucl. Instr. Meth. A<br/>A prototype Secondary-electron Emission Monitor (SEM) was installed in the 8 GeV proton transport line for the MiniBooNE experiment at Fermilab. The SEM is a segmented grid made with 5 um Ti foils, intended for use in the 120 GeV NuMI beam at Fermilab. Similar to previous workers, we found that the full collection of the secondary electron signal requires a bias voltage to draw the ejected electrons cleanly off the foils, and this effect is more pronounced at larger beam intensity. The beam centroid and width resolutions of the SEM were measured at beam widths of 3, 7, and 8 mm, and compared to calculations. Extrapolating the data from this beam test, we expect a centroid and width resolutions of 20um and 25 um, respectively, in the NuMI beam which has 1 mm spot size.<br/>
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