A new particle-induced X-ray emission set-up for laterally resolved analysis over wide areas

• DOI: 10.1016/j.nimb.2016.03.032
• Publication Date: 2016-04-09T07:00:21Z
• Authors: D. Hanf; J. Buchriegler; A.D. Renno; S. Merchel; F. Munnik; R. Ziegenrücker; O. Scharf; S.H. Nowak; J. von Borany
• Keywords: Sample (material); X-ray detector

Abstract The recently installed and unique PIXE (particle-induced X-ray emission) set-up at the Helmholtz-Zentrum Dresden-Rossendorf (HZDR) is mainly dedicated to applications for a detailed overview of elemental composition over large sample areas within a short time even at trace level. The so-called High-Speed-PIXE (HS-PIXE), a combination of a pnCCD-based pixel-detector with polycapillary X-ray optics, offers simultaneous imaging of sample areas up to 12 × 12 mm2 with a lateral resolution better than 100 μm. Each of the 264 × 264 individual pixels detects X-ray photons in an energy range from 2 keV to 20 keV with an energy resolution of 152 eV (@Mn-Kα). A high precision sample manipulator offers the inspection of areas up to 250 × 250 mm2. During first experiments the determined resolution is (76 ± 23) μm using a sample of well-known sharp-edged chromium patterns. Trace element analysis has been performed using a geological sample, a tin ore, with an average Ta-concentration below 0.1 at.%. Fine-zoned structures became visible in the Ta-Lα intensity map within only 45 min. The High-Speed-PIXE closes a gap in the analytical process flow chain especially for geoanalytical characterisations. It is a unique and fast detection system to identify areas of interest in comparably short time at large-area scale for further analysis.