Investigation of the synergistic effects on 4H-SiC junction barrier Schottky Diodes after multiple irradiation

• DOI: 10.1016/j.nimb.2024.165288
• Publication Date: 2024-02-15T17:23:56Z
• Authors: Mu He; Xiaoping Dong; Meiju Xiang; Yao Ma; Mingmin Huang; Sijie Zhang; Qingkui Yu; Shuang Cao; Zhongyu Lu; Yun Li; Zhimei Yang; Min Gong
• Keywords: Deep-level transient spectroscopy