New silicon-based micro-electro-mechanical systems for photo-acoustic trace-gas detection
Resonant frequency
Physics
QC1-999
Acoustics. Sound
QC221-246
Trace-gas sensing
Minimum detection limit
QC350-467
02 engineering and technology
Parts-per-billion sensitivity
Optics. Light
Micro-electro-mechanical systems (MEMS)
Quality factor
Acoustic-to-voltage transducer
0210 nano-technology
Photo-acoustic spectroscopy
Research Article
DOI:
10.1016/j.pacs.2024.100619
Publication Date:
2024-05-21T15:45:13Z
AUTHORS (12)
ABSTRACT
The achievable sensitivity level of photo-acoustic trace-gas sensors essentially depends on the performances of the acoustic transducer. In this work, the mechanical response of different silicon-based micro-electro-mechanical systems (MEMS) is characterized, aiming at investigating both their mechanical properties, namely the resonance frequency and the quality factor, and the minimum detection limit (MDL) achievable when they are exploited as an acoustic-to-voltage transducer in a trace-gas photoacoustic setup. For this purpose, a 4.56 µm Continuous-Wave (CW) quantum cascade laser (QCL) is used to excite a strong N(2)O roto-vibrational transition with a line strength of 2.14 × 10(−19) cm/molecule, and the detection of MEMS oscillations is performed via an interferometric readout. As a general trend, the minimum detection limit decreases when the resonance frequency investigated increases, achieving a value of 15 parts per billion with a 3 dB cut-off lock-in bandwidth equal to 100 mHz, around 10 kHz.
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