On abnormal growth of Goss grains in grain-oriented silicon steel

• DOI: 10.1016/j.scriptamat.2010.11.013
• Publication Date: 2010-11-13T04:31:59Z
• Authors: A. Morawiec
• Keywords: Recrystallization (geology); Electrical steel; Abnormal grain growth; Stored energy

A partial explanation of the phenomenon of abnormal growth of Goss-oriented grains in silicon steel is proposed. It follows from an observation that texture evolves toward Goss orientation if grains of low surface energy have a high probability of growth. A corresponding simulation starts with primary recrystallization texture and results in a strong Goss texture. To explain the development of early secondaries in subsurface layers, an option is considered that in addition to capillary forces, the growth is caused by surface-induced lattice instabilities.