Electrical transport properties of V2O5 thin films obtained by thermal annealing of layers grown by RF magnetron sputtering at room temperature

Electron Mobility
DOI: 10.1016/j.tsf.2015.06.048 Publication Date: 2015-07-05T03:18:39Z
ABSTRACT
Fil: Giannetta, Hernan. Instituto Nacional de Tecnologia Industrial. Centro de Micro y Nanoelectronica del Bicentenario; Argentina. Instituto Nacional de Tecnologia Agropecuaria. Centro Regional Buenos Aires Norte; Argentina
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