Measurement method of aberration from Ronchigram by autocorrelation function

Contrast transfer function
DOI: 10.1016/j.ultramic.2008.04.095 Publication Date: 2008-06-20T08:14:05Z
ABSTRACT
Aberrations up to the fifth-order were successfully measured using an autocorrelation function of the segmental areas of a Ronchigram. The method applied to aberration measurement in a newly developed 300kV microscope that is equipped with a spherical aberration corrector for probe-forming systems. The experimental Ronchigram agreed well with the simulated Ronchigram that was calculated by using the measured aberrations. The Ronchigram had an infinite magnification area with a half-angle of 50mrad, corresponding to the convergence angle of a uniform phase.
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