Use of Focused Ion Beam Milling for Preparation of Frozen-Hydrated Specimens for TEM Tomography

• DOI: 10.1017/s1431927607076520
• Publication Date: 2008-01-04T10:12:44Z
• Authors: M Marko; M Scheeff; N Salmon; C Hsieh; M Rodriguez; J Frank; C Mannella
• Keywords: Ion milling machine

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – 9,