Anomalous Scaling Exponents in the Capacitance–Voltage Characteristics of Perovskite Thin Film Devices

• DOI: 10.1021/acs.jpcc.8b09765
• Publication Date: 2018-11-15T19:56:03Z
• Authors: Vikas Nandal; Pradeep R. Nair
• Keywords: 01 natural sciences; 0104 chemical sciences

Capacitance–voltage measurements along with the Mott–Schottky (MS) analysis are widely used for characterization of material and device parameters. Using a simple analytical model, supported by det...