Delta-T Flicker Noise Demonstrated with Molecular Junctions

• DOI: 10.1021/acs.nanolett.3c04445
• Publication Date: 2024-01-31T06:03:14Z
• Authors: Ofir Shein-Lumbroso; Matthew Gerry; Abhay Shastry; Ayelet Vilan; Dvira Segal; Oren Tal
• Keywords: Flicker noise; Noise spectral density; Johnson–Nyquist noise

Electronic flicker noise is recognized as the most abundant in electronic conductors, either an unwanted contribution or a source of information on electron transport mechanisms and material properties. This typically observed when voltage difference applied across conductor current flowing through it. Here, we identify unknown type that found temperature nanoscale absence net charge bias. The revealed delta-T demonstrated molecular junctions characterized using quantum theory. expected to arise conductors subjected unintentional gradients, where it can be performance-limiting factor. On positive side, detect differences large variety down atomic-scale with no special setup requirements.