Degradation of Hole Transport Materials via Exciton-Driven Cyclization

• DOI: 10.1021/acsami.7b00208
• Publication Date: 2017-03-28T19:15:39Z
• Authors: Bruce M. Bell; Michael B. Clark; David D. Devore; Timothy S. De Vries; Robert D. Froese; Kaitlyn C. Gray; David H. K. Jackson; T. F. Kuech; Hong-Yeop Na; Kenneth L. Kearns; Kyung-Joo Lee; Sukrit Mukhopadhyay; Aaron A. Rachford; Liam P. Spencer; W. H. Hunter Wood...
• Keywords: Degradation

Organic light-emitting diode (OLED) displays have been an active and intense area of research for well over a decade now reached commercial success from cell phones to large format televisions. A more thorough understanding the many different potential degradation modes which cause OLED device failure will be necessary develop next generation materials, improve lifetime, ultimately cost vs performance ratio. Each organic layers in can susceptible unique decomposition pathways, however stability toward excitons is critical emissive layer (EML) materials as any near recombination zone. This study specifically focus on within hole transport (HTL) with goal being identify general paths occurring operating use this information design new derivatives block these pathways. Through post-mortem analyses several aged devices, apparently common intramolecular cyclization pathway has identified that was not previously reported arylamine-containing HTL operates parallel but faster than described fragmentation