Perfect X-ray focusing via fitting corrective glasses to aberrated optics

• DOI: 10.1038/ncomms14623
• Publication Date: 2017-03-01T16:34:04Z
• Authors: Frank Seiboth; Andreas Schropp; Maria Scholz; Felix Wittwer; Christian Rödel; Martin Wünsche; Tobias Ullsperger; Stefan Nolte; Jussi Rahomäki; Karolis Parfeniukas; Stylianos Giakoum...; Ulrich Vogt; Ulrich Wagner; Christoph Rau; Ulrike Boesenberg; Jan Garrevoet; Gerald Falkenberg; Eric C. Galtier; Hae Ja Lee; Bob Nagler; Christian G. Schroer
• Keywords: Strehl ratio; X-ray optics; Ptychography; Active optics

Abstract Due to their short wavelength, X-rays can in principle be focused down a few nanometres and below. At the same time, it is this wavelength that puts stringent requirements on X-ray optics metrology. Both are limited by today’s technology. In work, we present accurate at measurements of residual aberrations refractive lens using ptychography manufacture corrective phase plate. Together with fitted plate shows diffraction-limited performance, generating nearly Gaussian beam profile Strehl ratio above 0.8. This scheme applied any other focusing optics, thus solving optical problem synchrotron radiation sources free-electron lasers.