Surface dependent thermal evolution of the nanostructures in ultra-thin copper(ii) phthalocyanine films

• DOI: 10.1039/c2jm16224e
• Publication Date: 2012-03-26T08:32:25Z
• Authors: Hyo Jung Kim; Hyun Hwi Lee; Ji Whan Kim; Junhyuk Jang; Jang-Joo Kim
• Keywords: Small-angle X-ray scattering; Grazing-incidence small-angle scattering; Organic field-effect transistor; Coalescence (physics); Dewetting; Chemical Mechanical Planarization

The thermal evolution of the nano-grain structure and surface ultra thin copper(II) phthalocyanine (CuPc) films was investigated by real time grazing incidence small angle X-ray scattering (GI-SAXS) reflectivity measurements. strongly affected substrate energy. On hydrophilic Si, CuPc film consisted disk shaped nano-grains two different sizes. larger grains showed lateral crystal growth planarization annealing, while smaller did not increase in size. formed clusters at high temperature. hydrophobic are more randomly distributed. size upon annealing. Thermal annealing induced a random distribution with an roughness, large islands coalescence grains. models based on GI-SAXS analysis consistent temperature behavior hole mobilities organic field-effect transistor (OFET) devices fabricated both surfaces.