Effects of line defects on the electronic and optical properties of strain-engineered WO3 thin films

• DOI: 10.1039/c7tc03896h
• Publication Date: 2017-10-23T20:59:40Z
• Authors: Jing-ting Yang; Chao Ma; Chen Ge; Qing-hua Zhang; Jian-yu Du; Jian-kun Li; He-yi Huang; Meng He; Can Wang; Sheng Meng; Lin Gu; Hui-bin Lu; Guo-zhen Yang; Kui-juan Jin
• Keywords: Strain (injury); Line (geometry); Electronic materials

We report the discovery of a new line defect, and modification electronic structures in strain engineered WO₃ films.