Thermal-induced interface degradation in perovskite light-emitting diodes

• DOI: 10.1039/d0tc03816d
• Publication Date: 2020-09-08T08:21:46Z
• Authors: Yatao Zou; Tian Wu; Fan Fu; Sai Bai; Lei Cai; Zhongcheng Yuan; Yajuan Li; Ruiying Li; Weidong Xu; Tao Song; Yingguo Yang; Xingyu Gao; Feng Gao; Baoquan Sun
• Keywords: 4. Education; Materials Chemistry; Materialkemi; 01 natural sciences; 0104 chemical sciences

The poor operational stability remains a key challenge in perovskite light-emitting diodes. In this work, we investigate the detrimental effects of thermal-induced interface degradation on the device performance of perovskite light-emitting diodes.