Novel insights into nanoscale surface displacement detection in polystyrene thin films using photothermal mirror- and atomic force microscopy-mid-IR spectroscopy

• DOI: 10.1039/d5ra00555h
• Publication Date: 2025-03-26T10:16:10Z
• Authors: Ufuk Yilmaz; Gustavo V. B. Luk...; Elizandra Sehn; Yide Zhang; Nelson G. C. Astrath; Georg Ramer; Bernhard Lendl

Introduction of photothermal mirror spectroscopy employing a highly tunable mid-IR pump laser (PTM-IR) for the chemical analysis of polystyrene thin film samples on IR transparent calcium fluoride substrates.