Near‐field Raman spectroscopy using a sharp metal tip

• DOI: 10.1046/j.1365-2818.2003.01137.x
• Publication Date: 2003-06-03T16:11:22Z
• Authors: A. Hartschuh; N. Anderson; L. Novotny
• Keywords: Raster scan

Near-field Raman spectroscopy with a spatial resolution of 20 nm is demonstrated by raster scanning sharp metal tip over the sample surface. The method used to image vibrational modes single-walled carbon nanotubes. By combining optical and topographical signals rendered nanotubes, we can separate near-field far-field contributions quantify observed enhancement factors.