All high T c edge-geometry weak links utilizing Y-Ba-Cu-O barrier layers

• DOI: 10.1063/1.106321
• Publication Date: 2002-07-26T13:36:40Z
• Authors: B. D. Hunt; M. C. Foote; L. J. Bajuk

High quality YBa2Cu3O7−x/normal-metal/YBa2Cu3O7−x edge-geometry weak links have been fabricated using nonsuperconducting Y-Ba-Cu-O barrier layers deposited by laser ablation at reduced growth temperatures. Devices incorporating 25–100 Å thick exhibit current-voltage characteristics consistent with the resistively shunted junction model, strong microwave and magnetic field response temperatures up to 85 K. The critical currents vary exponentially thickness, resistances scale linearly interlayer thickness device area, indicating good uniformity, an effective normal metal coherence length of 20 Å.