Defect structure studies of bulk and nano-indium-tin oxide

• DOI: 10.1063/1.1783610
• Publication Date: 2004-09-27T22:03:00Z
• Authors: G. B. González; T. O. Mason; J. P. Quintana; O. Warschkow; D. E. Ellis; J.-H. Hwang; J. P. Hodges; J. D. Jorgensen
• Keywords: Indium tin oxide

The defect structure of bulk and nano-indium-tin oxide was investigated by a combination experimental techniques, including high-resolution synchrotron x-ray diffraction, extended absorption fine structure, time-of-flight neutron diffraction on powder specimens. structural results include atomic positions, cation distributions, oxygen interstitial populations for oxidized reduced materials. These parameters were correlated with theoretical calculations in situ electrical conductivity thermopower measurements as well existing models, special reference to the model Frank Köstlin [G. H. Köstlin, Appl. Phys. A 27, 197 (1982)].