Ferroelectric domain inversion and its stability in lithium niobate thin film on insulator with different thicknesses

• DOI: 10.1063/1.4959197
• Publication Date: 2016-07-15T17:09:36Z
• Authors: Guang-hao Shao; Yu-hang Bai; Guo-xin Cui; Chen Li; Xiang-biao Qiu; De-qiang Geng; Di Wu; Yan-qing Lu
• Keywords: Poling

Ferroelectric domain inversion and its effect on the stability of lithium niobate thin films insulator (LNOI) are experimentally characterized. Two sets specimens with different thicknesses varying from submicron to microns selected. For micron thick samples (∼28 μm), structures achieved by pulsed electric field poling electrodes patterned via photolithography. No structure deterioration has been observed for a month as inspected using polarizing optical microscopy etching. As (540 nm) films, large-area is realized scanning biased conductive tip in piezoelectric force microscope. A graphic processing method taken evaluate retention. life time 25.0 h obtained possible mechanisms discussed. Our study gives direct reference structure-related applications LNOI, including guiding wave nonlinear frequency conversion, wavefront tailoring, electro-optic modulation, devices.