Direct observation of the stress-induced domain structure in lead-free (Na1/2Bi1/2)TiO3-based ceramics

• DOI: 10.1063/1.5084255
• Publication Date: 2019-02-04T18:15:05Z
• Authors: Alexander Martin; Hana Uršič; Tadej Rojac; Kyle G. Webber
• Keywords: Piezoresponse force microscopy; Ferroelectric ceramics

In this work, the creep behavior of (Na1/2Bi1/2)TiO3-0.07BaTiO3 was characterized as a function bias stress up to −500 MPa, revealing time-dependence stress-induced relaxor-to-ferroelectric long-range order transformation. Creep strain observed across range applied compressive levels, in particular at stresses approximately 50% above critical coercive stress, indicating significant transformation on ferroelectric order. The macroscopic is discussed conjunction with ex situ piezoresponse force microscopy measurements that directly show formation domains mechanically loaded relaxor ferroelectrics.