Multi-contrast benchmarking of edge illumination Monte Carlo simulations using virtual gratings

• DOI: 10.1063/5.0244152
• Publication Date: 2025-03-10T11:10:51Z
• Authors: Jonathan Sanctorum; Jan Sijbers; Jan De Beenhouwer

In recent years, the complementary nature of multi-contrast imaging has increased the popularity of x-ray phase contrast imaging, including edge illumination. However, edge illumination system optimization most often relies on phase and transmission contrast only, without considering dark field contrast. Computer simulations are a widespread approach to design and optimize imaging systems, including the benchmarking of simulation results, i.e., the comparison to a reference value. Providing such a reference is, however, particularly challenging for the dark field signal. In this work, we present a practical method to directly estimate transmission, refraction, and dark field contrast reference values from simulated x-ray trajectories in Monte Carlo simulations. This allows an immediate comparison of the retrieved simulated contrasts to their respective references. We show how the generated reference values can be used effectively for benchmarking simulation results and discuss other potential applications of the presented approach.