Electric-Field Sensing with a Scanning Fiber-Coupled Quantum Dot

• DOI: 10.1103/physrevapplied.8.031002
• Publication Date: 2017-09-29T10:55:50Z
• Authors: D. Cadeddu; M. Munsch; N. Rossi; J.-M. Gérard; J. Claudon; R. J. Warburton; M. Poggio
• Keywords: Scanning Probe Microscopy

Over the years, a number of nanoscale electric-field sensors that can image single surface charges have been developed. Due to intrinsic limitations their electrical or mechanical detection schemes, however, most operate at frequencies below 1 kHz. This study presents scanning sensor based on an optically active semiconductor quantum dot, combining exquisite sensitivity and resolution with high bandwidth. In addition demonstrating sensor's feasibility, authors lay out improvements required take its performance physical limit, measure charging dynamics individual tunneling events in few-electron mesoscopic systems.