Fullwave-mode analysis of shielded microstrip discontinuities on anisotropic substrates

0202 electrical engineering, electronic engineering, information engineering 02 engineering and technology
DOI: 10.1109/icecs.2012.6463627 Publication Date: 2013-02-23T02:18:16Z
ABSTRACT
This paper presents a full-wave FDTD analysis of open/shielded microstrip discontinuities on anisotropic substrates through the evaluation of their S parameters. A wideband Gaussian pulse excitation was used to obtain frequency-domain information from dc up to the desired cutoff frequency. Numerical results demonstrate the necessity to include the effect of dielectric anisotropy in the modeling of microstrip discontinuities.
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