Performance Analysis of Ge and InP MOSFETs in High Current Applications with SiO2/Al2O3/Ga2O3 Gate Oxides
DOI:
10.1109/icrest63960.2025.10914461
Publication Date:
2025-03-14T17:44:59Z
AUTHORS (5)
ABSTRACT
SUPPLEMENTAL MATERIAL
Coming soon ....
REFERENCES (21)
CITATIONS (0)
EXTERNAL LINKS
PlumX Metrics
RECOMMENDATIONS
FAIR ASSESSMENT
Coming soon ....
JUPYTER LAB
Coming soon ....