CORRELATION OF CRITICAL TEMPERATURES AND ELECTRICAL PROPERTIES IN TITANIUM FILMS

• DOI: 10.1142/s021797920301687x
• Publication Date: 2003-04-22T08:57:06Z
• Authors: C. GANDINI; V. LACQUANITI; E. MONTICONE; C. PORTESI; M. RAJTERI; M. L. RASTELLO; E. PASCA; G. VENTURA
• Keywords: 0103 physical sciences; 01 natural sciences

Recently transition-edge sensors (TES) have obtained an increasing interest as light detectors due to their high energy resolution and broadband response. Titanium (Ti), with transition temperature up 0.5 K, is among the suitable materials for TES application. In this work we investigate Ti films from two of different purity deposited by e-gun on silicon nitride. Films thickness deposition substrate been measured. Critical temperatures, electrical resistivities structural properties x-ray are related each other.